- POL: Malus's law; measurement of the state of polarisation; properties of half, quarter and arbitrary
wave plates (Stokes parameters, the polarisation ellipse and the Poincaré sphere); strain birefringence
and its application to strain sensing
- R&R: Reflection and refraction; Snell's Law; Fresnel relationships; Brewster's angle, critical angle
and TIR; determination of the refractive index of an optical element
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- DIFF: Fraunhofer and Fresnel diffraction of apertures and slits; measurement of the width of unknown
slits and apertures; diffraction at a reflective grating; determination of the wavelength of a laser; diffraction
through a transmission grating.
- I&C: The Michelson interferometer; multiple and single fringe alignment configurations; fringe visibility;
examination of optical elements; source coherence function; measurement of coherence length and cavity length of
Fabry-Perot laser
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